Elec­tro­mag­netic com­pat­i­bil­ity test­ing in EMC lab

EN 61000–4–11:2003 Elec­tro­mag­netic com­pat­i­bil­ity (EMC) — Part 4 – 11: Test­ing and mea­sure­ment tech­niques — Volt­age dips, short inter­rup­tions and volt­age vari­a­tions immu­nity tests

Replace: EN 61000 – 4-11:1994 + A1:2001 Elec­tro­mag­netic com­pat­i­bil­ity (EMC) — Part 4 – 11: Test­ing and mea­sure­ment tech­niques — Volt­age dips, short inter­rup­tions and volt­age vari­a­tions immu­nity tests

Ana­log: IEC 61000 – 4-11:2004 Elec­tro­mag­netic com­pat­i­bil­ity (EMC) — Part 4 – 11: Test­ing and mea­sure­ment tech­niques — Volt­age dips, short inter­rup­tions and volt­age vari­a­tions immu­nity tests

Scope
Inter­na­tional stan­dard EN 61000 – 4-11:2004 defines immu­nity test meth­ods and rec­om­mended test lev­els for elec­tric and elec­tronic equip­ment con­nected to low volt­age AC mains net­works for volt­age dips, short inter­rup­tions and volt­age vari­a­tions. Require­ments are applic­a­ble to equip­ment with rated cur­rent up to 16A in 50Hz or 60Hz net­work.

Gen­eral
Since dis­tur­bances in the mains volt­age are com­mon place and they can inter­fere with every kind of elec­tri­cal and elec­tron­i­cal sys­tem that oper­ates from the mains net­work it is manda­tory to test all elec­tri­cal equip­ment that can be con­nected to mains net­work.
Dips are short term reduc­tions in sup­ply volt­age caused by load switch­ing and fault clear­ance in the mains sup­ply net­work. They can also be caused by switch­ing between the mains and alter­na­tive sup­plies. Dips are spec­i­fied by their reduc­tion below nom­i­nal mains volt­age and their dura­tion in mil­lisec­onds or num­ber of cycles. A dip of 40% is equiv­a­lent to a reduc­tion of sup­ply volt­age to 60% of its nom­i­nal value.
Short volt­age inter­rup­tion is a 95%-100% dip that lasts at least few sec­onds. Shor volt­age inter­rup­tions are caused by load switch­ing between mains and an alter­na­tive sup­ply.
Electro­mechan­i­cal devices like relays, con­tac­tors, sole­noids can change their state. Dis­charge lamps often won’t re-​illuminate for a min­utes after a short mains inter­rup­tion.

Test level
Inter­na­tional stan­dard EN 61000 – 4-11:2004 defines rec­om­mended test lev­els for var­i­ous equip­ment classes, but spe­cific test lev­els should be picked up from generic stan­dards or prod­uct stan­dards.

Volt­age dips


Shot volt­age interruption

A dip of 40% is equiv­a­lent to a reduc­tion of sup­ply volt­age to 60% of its nom­i­nal value.

Volt­age inter­rup­tion of 0% is equiv­a­lent to a reduc­tion of sup­ply volt­age to 100% of its nom­i­nal value.


Elec­tro­mag­netic envi­ron­ment classes are defined as fol­lows:
Class 1: It applies to pro­tected power sup­plies with com­pat­i­bil­ity lev­els lower than pub­lic net­work level. It is applic­a­ble to very dis­tur­bance sen­si­tive equip­ment in terms of sup­ply volt­age– instru­men­ta­tion in lab­o­ra­to­ries, automa­tion and pro­tec­tion equip­ment, com­put­ers car­ing out crit­i­cal work load;

Class 2: it applies to point of com­mon cou­pling for con­sumer sys­tems and in-​plant point f com­mon cou­pling in the indus­trial envi­ron­ment in gen­eral;

Class 3: It applies to in-​plant com­mon cou­pling points in indus­trial envi­ron­ments;


Per­for­mance cri­te­rion
The tests results are clas­si­fied in terms of loss of func­tion or degra­da­tion of per­for­mance. Inter­na­tional stan­dard EN 61000 – 4-11:2004 does not define Pass/​Fail cri­te­ria. This is defined by generic or spe­cific prod­uct stan­dards. EN 61000 – 4-11:2004 defines per­for­mance cri­te­ria that can be used to eval­u­ate equip­ment under test per­for­mance.

Per­for­mance cri­te­rion A
Nor­mal per­for­mance within lim­its spec­i­fied by the man­u­fac­turer;

Per­for­mance cri­te­rion B
Tem­po­rary loss of func­tion or degra­da­tion of per­for­mance. Self-​recovery after the test, with­out oper­a­tor inter­ven­tion;

Per­for­mance cri­te­rion C
Tem­po­rary loss of func­tion or degra­da­tion of per­for­mance. Oper­a­tor inter­ven­tion needed for recov­ery after the test;

Per­for­mance cri­te­rion D
Loss of func­tion or degra­da­tion of per­for­mance which is not recov­er­able. Dam­age
of hard­ware or soft­ware, or loss of data.

The manufacturer’s spec­i­fi­ca­tion may define effects on the EUT which may be con­sid­ered insignif­i­cant, and there­fore accept­able.


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